Speaker: Warren Straszheim, Manager of the Materials Analysis and Research Lab at Iowa State University
Title: How Not to Do Poor Microanalysis of Nanomaterials
Abstract: Scanning electron microscopy (SEM) and energy-dispersive spectroscopy (EDS) are powerful tools for microcharacterization. They are generally available and are commonly introduced at the undergraduate level and widely used at the graduate level. However, just because they are commonly available does not mean they are automatically used well. This talk will address several factors that determine the success and usefulness of characterization, particularly at the nano level. Issues of coating thickness or sample contamination or interaction volume are functionally irrelevant when dealing with scales of tens of microns. However, those issues are especially important for features measured in tens of nanometers. It will also touch on statistical issues that come into play for resolution limits as well as for detection limits.
Bio: Warren Straszheim received his B.S. in Engineering Science from Iowa State University with a strong emphasis on materials. That was before ISU had such a strong MSE program. He continued on to receive an M.S. and Ph.D. in Engineering Mechanics from ISU, again with an emphasis on materials and microcharacterization using scanning electron microscopy and energy-dispersive x-ray analysis. The application of those techniques in novel ways was the focus of his research career. He is now the manager of the Materials Analysis and Research Lab where his expertise is made available along with the instrumentation to researchers at ISU and beyond.
Seminar Host: Steve Martin