The photo on the left shows the sample chamber located at the base of the column. The bottom of the objective lens and various detectors are located inside the sample chamber.
The lens that focuses the beam of electrons towards the sample is in the left of the picture. The parts off to the right are different detectors. One is for detecting the secondary electrons and the other is for detecting the backscattered electrons. The operator has the power to choose and switch detectors for use on each sample. Using the secondary electron detector produces a clear and focused topographical image of the sample. The backscatter electron detector produces an image that is useful when determining the make-up of the sample. Each element in the sample appears as a different shade, from almost white to black.
A prepared sample is mounted on a specimen stub and placed on the stage.