Location: 3365 Hoover Hall
The Scanning Electron Microscopy and X-Ray Diffraction lab is used extensively by undergraduates, graduates, and post-docs for materials characterization and failure analysis. Scientists study the surface, morphology, chemical composition, and crystal structure of their specimens.
Also in this lab, the Fourier Transform InfraRed and UltraViolet-Visible Spectrometers are excellent analytical tools for studying optical properties and identifying and quantifying the components of a variety of materials.
For equipment questions, lab concerns, safety problems, or general help in this room, contact firstname.lastname@example.org
Some equipment is available to use on a Fee For Service basis and requires in-person training. To sign up for training, please visit our Equipment Training & Cost website.